Issue Date | Title | Author(s) |
1994 | Diffraction theory of Fresnel lenses encoded in low-resolution devices | Carcolé i Carrubé, Eduard; Bosch i Puig, Salvador; Campos Coloma, Juan |
6-Jul-2000 | Disseny d'un protocol numèric per a la classificació invariant d'imatges aplicant tècniques multivariants | Riba Ruiz, Jordi-Roger |
1995 | Numerical investigation of iso-spectral cavities built from trinagles | Wu, H. (Hua); Sprung, Donald W. L.; Martorell Domenech, Juan |
2001 | Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings | Ferré Borrull, Josep; Duparré, Angela; Quesnel, Etienne |
2000 | Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm | Ferré Borrull, Josep; Duparré, Angela; Quesnel, Etienne |
2001 | Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components | Duparré, Angela; Ferré Borrull, Josep; Gliech, Stefan; Notni, Gunther; Steinert, Jörg; Bennett, Jean M. |
2002 | Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation | Ristau, Detlev; Günster, Stefan; Bosch i Puig, Salvador; Duparré, Angela; Masetti, Enrico; Ferré Borrull, Josep; Kiriakidis, George; Peiró Martínez, Francisca; Quesnel, Etienne; Tihhonravov, Alexander |
2003 | Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization | Sancho i Parramon, Jordi; Ferré Borrull, Josep; Bosch i Puig, Salvador; Ferrara, Maria Christina |