| Issue Date | Title | Author(s) |
| 1996 | Application of fuzzy-rule-based postprocessing to correlation methods in pattern recognition | Wolf, T.; Gutmann, B.; Weber, H.; Ferré Borrull, Josep; Bosch i Puig, Salvador; Vallmitjana i Rico, Santiago |
| 2001 | Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings | Ferré Borrull, Josep; Duparré, Angela; Quesnel, Etienne |
| 2000 | Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm | Ferré Borrull, Josep; Duparré, Angela; Quesnel, Etienne |
| 2001 | Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components | Duparré, Angela; Ferré Borrull, Josep; Gliech, Stefan; Notni, Gunther; Steinert, Jörg; Bennett, Jean M. |
| 2002 | Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation | Ristau, Detlev; Günster, Stefan; Bosch i Puig, Salvador; Duparré, Angela; Masetti, Enrico; Ferré Borrull, Josep; Kiriakidis, George; Peiró Martínez, Francisca; Quesnel, Etienne; Tihhonravov, Alexander |
| 2003 | Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization | Sancho i Parramon, Jordi; Ferré Borrull, Josep; Bosch i Puig, Salvador; Ferrara, Maria Christina |
