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https://dipositint.ub.edu/dspace/handle/2445/197427
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DC Field | Value | Language |
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dc.contributor.author | Checa, Martí | - |
dc.contributor.author | Jin, Xin | - |
dc.contributor.author | Millán Solsona, Rubén | - |
dc.contributor.author | Neumayer, Sabine M. | - |
dc.contributor.author | Susner, Michael A. | - |
dc.contributor.author | McGuire, Michael A. | - |
dc.contributor.author | O'Hara, Andrew | - |
dc.contributor.author | Gomila Lluch, Gabriel | - |
dc.contributor.author | Maksymovych, Petro | - |
dc.contributor.author | Pantelides, Socrates T. | - |
dc.contributor.author | Collins, Liam | - |
dc.date.accessioned | 2023-05-02T08:55:48Z | - |
dc.date.available | 2023-08-23T05:10:31Z | - |
dc.date.issued | 2022-08-23 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | http://hdl.handle.net/2445/197427 | - |
dc.description.abstract | Van der Waals layered ferroelectrics, such as CuInP2S6 (CIPS), offer a versatile platform for miniaturization of ferroelectric device technology. Control of the targeted composition and kinetics of CIPS synthesis, enables the formation of stable self-assembled heterostructures of ferroelectric CIPS and non-ferroelectric In4/3P2S6 (IPS). Here, we use advanced quantitative scanning probe microscopy and density-functional-theory to explore in detail the nanoscale variability in dynamic functional properties of the CIPS-IPS heterostructure. We report evidence of fast ionic transport mediating an appreciable out-of-plane electromechanical response of CIPS in the paraelectric phase. Further, we map the local dielectric constant and ionic conductivity on the nanoscale as we thermally stimulate the ferroelectric-paraelectric phase transition, recovering the bulk dielectric peak of the transition at the nanoscale. Finally, we discover a conductivity enhancement at the CIPS/IPS interface, indicating the possibility of engineering its interfacial properties for next generation device applications. | - |
dc.format.extent | 29 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | American Chemical Society | - |
dc.relation.isformatof | Versió postprint del document publicat a: https://doi.org/10.1021/acsnano.2c06992 | - |
dc.relation.ispartof | ACS Nano, 2022, vol. 16, num. 9, p. 15347-15357 | - |
dc.relation.uri | https://doi.org/10.1021/acsnano.2c06992 | - |
dc.rights | (c) American Chemical Society , 2022 | - |
dc.source | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) | - |
dc.subject.classification | Microscòpia electrònica d'escombratge | - |
dc.subject.classification | Nanotecnologia | - |
dc.subject.classification | Microscòpia de força atòmica | - |
dc.subject.other | Scanning electron microscopy | - |
dc.subject.other | Nanotechnology | - |
dc.subject.other | Atomic force microscopy | - |
dc.title | Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface | - |
dc.type | info:eu-repo/semantics/article | - |
dc.type | info:eu-repo/semantics/acceptedVersion | - |
dc.identifier.idgrec | 729157 | - |
dc.date.updated | 2023-05-02T08:55:48Z | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | - |
Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) Articles publicats en revistes (Institut de Bioenginyeria de Catalunya (IBEC)) |
Files in This Item:
File | Description | Size | Format | |
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729157.pdf | 1.66 MB | Adobe PDF | View/Open |
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