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DC Field | Value | Language |
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dc.contributor.author | García Veigas, Francisco Javier | - |
dc.contributor.author | Prats Miralles, Eva | - |
dc.contributor.author | Domínguez Ximénez, Anna | - |
dc.contributor.author | Villuendas Latorre, Aránzazu | - |
dc.date.accessioned | 2012-09-28T14:15:14Z | - |
dc.date.available | 2012-09-28T14:15:14Z | - |
dc.date.issued | 2012 | - |
dc.identifier.uri | https://hdl.handle.net/2445/32147 | - |
dc.description | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 | - |
dc.description.abstract | Nowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in the production of several radiation types than can be detected and analysed by specific detectors, providing information of the chemistry and crystallography of the studied material. From this point of view, the chamber of a SEM can be considered as a laboratory where different experiments can be carried out. The application of SEM to geology, especially in the fields of mineralogy and petrology has been summarised by Reed (1996).The aim of this paper is to show some recent applications in the characterization of geologic materials. | eng |
dc.format.extent | 10 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | eng |
dc.publisher | Centres Científics i Tecnològics. Universitat de Barcelona | cat |
dc.relation.isformatof | Reproducció del document original | - |
dc.relation.ispartof | Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.5, 12 p. | - |
dc.relation.uri | http://hdl.handle.net/2445/32166 | - |
dc.rights | (c) Universitat de Barcelona, 2012 | - |
dc.source | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) | - |
dc.subject.classification | Microscòpia electrònica d'escombratge | cat |
dc.subject.classification | Geologia | cat |
dc.subject.classification | Anàlisi instrumental | cat |
dc.subject.other | Scanning electron microscopy | eng |
dc.subject.other | Geology | eng |
dc.subject.other | Instrumental analysis | eng |
dc.title | Advanced applications of scanning electron microscopy in geology | eng |
dc.type | info:eu-repo/semantics/bookPart | eng |
dc.type | info:eu-repo/semantics/publishedVersion | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | eng |
Appears in Collections: | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) |
Files in This Item:
File | Description | Size | Format | |
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MT05 - Advanced applications of SEM_ed2.pdf | 2.21 MB | Adobe PDF | View/Open |
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