Please use this identifier to cite or link to this item:
https://dipositint.ub.edu/dspace/handle/2445/32162
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Oncins Marco, Gerard | - |
dc.contributor.author | Díaz Marcos, Jordi | - |
dc.date.accessioned | 2012-10-01T08:20:05Z | - |
dc.date.available | 2012-10-01T08:20:05Z | - |
dc.date.issued | 2012 | - |
dc.identifier.uri | http://hdl.handle.net/2445/32162 | - |
dc.description | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 | - |
dc.description.abstract | Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments. | eng |
dc.format.extent | 10 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | eng |
dc.publisher | Centres Científics i Tecnològics. Universitat de Barcelona | cat |
dc.relation.isformatof | Reproducció del document original | - |
dc.relation.ispartof | Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.7, 10 p. | - |
dc.relation.uri | http://hdl.handle.net/2445/32166 | - |
dc.rights | (c) Universitat de Barcelona, 2012 | - |
dc.source | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) | - |
dc.subject.classification | Microscòpia de força atòmica | cat |
dc.subject.classification | Nanotecnologia | cat |
dc.subject.classification | Anàlisi instrumental | cat |
dc.subject.other | Atomic force microscopy | eng |
dc.subject.other | Nanotechnology | eng |
dc.subject.other | Instrumental analysis | eng |
dc.title | Atomic force microscopy: probing the nanoworld | eng |
dc.type | info:eu-repo/semantics/bookPart | eng |
dc.type | info:eu-repo/semantics/publishedVersion | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | eng |
Appears in Collections: | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
MT07 - Atomic Force Microscopy_ed2.pdf | 2.57 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.