Please use this identifier to cite or link to this item:
https://dipositint.ub.edu/dspace/handle/2445/32165| Title: | Secondary Ion Mass Spectrometry (SIMS): principles and applications |
| Author: | López Fernández, Francisco |
| Keywords: | Espectrometria de masses Anàlisi instrumental Mass spectrometry Instrumental analysis |
| Issue Date: | 2012 |
| Publisher: | Centres Científics i Tecnològics. Universitat de Barcelona |
| Abstract: | This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique in varied scientific fields. |
| Note: | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 |
| Note: | Reproducció del document original |
| It is part of: | Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.10, 14 p. |
| URI: | http://hdl.handle.net/2445/32165 |
| Related resource: | http://hdl.handle.net/2445/32166 |
| Appears in Collections: | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| MT10 - Secondary Ion Mass Spectrometry_ed2.pdf | 1.04 MB | Adobe PDF | View/Open |
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