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Issue Date	Title	Author(s)
1986	Spectroscopic ellipsometry study of the In1-x Gax Asy P1-y / InP Heterojunctions grown by metalorganic chemical-vapor deposition	Drévillon, B.; Bertrán Serra, Enric; Alnot, P.; Olivier, J.; Razeghi, M.
1984	Electron tunneling in heavily In-doped polycrystalline CdS films	García-Cuenca Varona, María Victoria; Morenza Gil, José Luis; Esteve Pujol, Joan
1996	Microstructure of highly oriented, hexagonal, boron nitride thin films grown on crystalline silicon by radio frequency plasma-assisted chemical vapor deposition	Andújar Bella, José Luis; Bertrán Serra, Enric; Manniete, Y.
1992	Properties of amorphous silicon thin films grown in square wave modulated silane rf discharges.	Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Serra-Miralles, J.; Roch i Cunill, Carles; Lloret, A.
1991	Optical absorption and graphitic clusters of hydrogenated amorphophous carbon thin films	Pascual Miralles, Esther; Serra Rodríguez, Carmen; Bertrán Serra, Enric
2011	The Electronic Structure of Co-Sputtered Zinc Indium Tin Oxide Thin Films	Carreras Seguí, Paz; Gutmann, Sebastian; Antony, Aldrin; Bertomeu i Balagueró, Joan; Schlaf, Rudy
2011	Electrical and optical properties of Zn-In-Sn-O transparent conducting thin films	Carreras Seguí, Paz; Antony, Aldrin; Rojas Tarazona, Fredy E.; Bertomeu i Balagueró, Joan
2010	Uniformity Study of Amorphous and Microcrystalline Silicon Thin Films Deposited on 10cmx10cm Glass Substrate using Hot Wire CVD Technique	Frigeri, Paolo Antonio; Nos Aguilà, Oriol; Calvo, J. D.; Carreras Seguí, Paz; Roldán Molinero, Rubén; Antony, Aldrin; Asensi López, José Miguel; Bertomeu i Balagueró, Joan
2005	Optical analysis of textured plastic substrates to be used in thin silicon solar cells	Escarré i Palou, Jordi; Villar, Fernando; Fonrodona Turon, Marta; Soler Vilamitjana, David; Asensi López, José Miguel; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi
1996	New features of the layer-by-layer deposition of microcrystalline silicon films revealed by spectroscopic ellipsometry and high resolution transmission electron microscopy	Roca i Cabarrocas, P. (Pere); Hamma, S.; Hadjadj, A.; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi